Removing Temperature Effects from Impedance-based Damage Detection Technique Using Principal Component Analysis
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yun, Chung Bang | - |
| dc.contributor.author | Koo, Ki Young | - |
| dc.contributor.author | Park, Seunghee | - |
| dc.contributor.author | Lee, Jong-Jae | - |
| dc.date.accessioned | 2013-03-27T08:01:24Z | - |
| dc.date.available | 2013-03-27T08:01:24Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2008-02 | - |
| dc.identifier.citation | Proceedings of IMAC XXVI Conference & Exposition, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/160629 | - |
| dc.language | ENG | - |
| dc.title | Removing Temperature Effects from Impedance-based Damage Detection Technique Using Principal Component Analysis | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Proceedings of IMAC XXVI Conference & Exposition | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Yun, Chung Bang | - |
| dc.contributor.nonIdAuthor | Koo, Ki Young | - |
| dc.contributor.nonIdAuthor | Park, Seunghee | - |
| dc.contributor.nonIdAuthor | Lee, Jong-Jae | - |
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