DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Soon-Bok | - |
dc.contributor.author | Son, HY | - |
dc.contributor.author | Kim, I | - |
dc.contributor.author | Park, JH | - |
dc.contributor.author | Jung, GJ | - |
dc.contributor.author | Park, BJ | - |
dc.contributor.author | Byun, KY | - |
dc.contributor.author | Paik, KW | - |
dc.date.accessioned | 2013-03-27T06:57:51Z | - |
dc.date.available | 2013-03-27T06:57:51Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008 | - |
dc.identifier.citation | EPTC 2008, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/160164 | - |
dc.language | ENG | - |
dc.title | Thermal Cycling Reliability Issue of Thick Cu Column Based Cu/SnAg Double-Bump Flip Chip Assemblies on Organic Substrates for Fine Pitch Applications | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | EPTC 2008 | - |
dc.identifier.conferencecountry | Singapore | - |
dc.identifier.conferencecountry | Singapore | - |
dc.contributor.localauthor | Lee, Soon-Bok | - |
dc.contributor.nonIdAuthor | Son, HY | - |
dc.contributor.nonIdAuthor | Kim, I | - |
dc.contributor.nonIdAuthor | Park, JH | - |
dc.contributor.nonIdAuthor | Jung, GJ | - |
dc.contributor.nonIdAuthor | Park, BJ | - |
dc.contributor.nonIdAuthor | Byun, KY | - |
dc.contributor.nonIdAuthor | Paik, KW | - |
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