Power/ground Noise Immunity Test in Wireless and High-speed UWB Communication System
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Yoon, Changwook | ko |
| dc.contributor.author | Park, Hyunjeong | ko |
| dc.contributor.author | Lee, Woojin | ko |
| dc.contributor.author | Shin, Minchul | ko |
| dc.contributor.author | Pak, Jun So | ko |
| dc.date.accessioned | 2013-03-27T05:49:39Z | - |
| dc.date.available | 2013-03-27T05:49:39Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-12 | - |
| dc.identifier.citation | IEEE Electromagnetic Compatibility Symposium, EMC, pp.1 - 6 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/159683 | - |
| dc.language | English | - |
| dc.publisher | 123 | - |
| dc.title | Power/ground Noise Immunity Test in Wireless and High-speed UWB Communication System | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000263416300096 | - |
| dc.identifier.scopusid | 2-s2.0-84954278034 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1 | - |
| dc.citation.endingpage | 6 | - |
| dc.citation.publicationname | IEEE Electromagnetic Compatibility Symposium, EMC | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Detroit, MI | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Yoon, Changwook | - |
| dc.contributor.nonIdAuthor | Park, Hyunjeong | - |
| dc.contributor.nonIdAuthor | Lee, Woojin | - |
| dc.contributor.nonIdAuthor | Shin, Minchul | - |
| dc.contributor.nonIdAuthor | Pak, Jun So | - |
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