Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.date.accessioned | 2013-03-27T02:54:59Z | - |
| dc.date.available | 2013-03-27T02:54:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-04-09 | - |
| dc.identifier.citation | 2007 Materials Research Society Spring Meeting, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/158436 | - |
| dc.language | ENG | - |
| dc.title | Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 2007 Materials Research Society Spring Meeting | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Lee, Jeong Yong | - |
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