DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Byung Jin | - |
dc.contributor.author | Tong, Y | - |
dc.contributor.author | Dalapati, GK | - |
dc.contributor.author | Oh, HJ | - |
dc.date.accessioned | 2013-03-27T02:25:32Z | - |
dc.date.available | 2013-03-27T02:25:32Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-05-06 | - |
dc.identifier.citation | 211th Electrochemical Society Meeting, v., no., pp.0 - 0 | - |
dc.identifier.uri | http://hdl.handle.net/10203/158272 | - |
dc.language | ENG | - |
dc.title | The effect of Interfacial Layer of High-K Dielectrics on GaAs Substrate | - |
dc.title.alternative | The effect of Interfacial Layer of High-K Dielectrics on GaAs Substrate | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 0 | - |
dc.citation.endingpage | 0 | - |
dc.citation.publicationname | 211th Electrochemical Society Meeting | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Cho, Byung Jin | - |
dc.contributor.nonIdAuthor | Tong, Y | - |
dc.contributor.nonIdAuthor | Dalapati, GK | - |
dc.contributor.nonIdAuthor | Oh, HJ | - |
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