Minimizing leakage of sequential circuits through flip-flop skewing and technology mapping
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Heo, S | ko |
| dc.contributor.author | Shin, Youngsoo | ko |
| dc.date.accessioned | 2013-03-27T02:07:02Z | - |
| dc.date.available | 2013-03-27T02:07:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-10-16 | - |
| dc.identifier.citation | ISOCC | - |
| dc.identifier.uri | http://hdl.handle.net/10203/158150 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Minimizing leakage of sequential circuits through flip-flop skewing and technology mapping | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ISOCC | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | COEX Conference Center, Seoul | - |
| dc.contributor.localauthor | Shin, Youngsoo | - |
| dc.contributor.nonIdAuthor | Heo, S | - |
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