DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, JH | - |
dc.contributor.author | Lee, Soon-Bok | - |
dc.date.accessioned | 2013-03-26T01:41:03Z | - |
dc.date.available | 2013-03-26T01:41:03Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2007-11-19 | - |
dc.identifier.citation | International Conference on Electronic Materials and Packaging 2007, EMAP 2007, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/156849 | - |
dc.language | ENG | - |
dc.title | High resolution AFM Moire technique for the detection of defects in nano structure | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-51249091918 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Electronic Materials and Packaging 2007, EMAP 2007 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Lee, Soon-Bok | - |
dc.contributor.nonIdAuthor | Park, JH | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.