Filling of very fine via holes for 3-D SiP by using ionized metal plasma sputtering and electroplating

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dc.contributor.authorLee, Won-Jong-
dc.contributor.authorCho, BH-
dc.date.accessioned2013-03-26T00:34:15Z-
dc.date.available2013-03-26T00:34:15Z-
dc.date.created2012-02-06-
dc.date.issued2007-04-18-
dc.identifier.citationICEP (International Conference on electronics packaging) 2007, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/156420-
dc.languageENG-
dc.titleFilling of very fine via holes for 3-D SiP by using ionized metal plasma sputtering and electroplating-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameICEP (International Conference on electronics packaging) 2007-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorLee, Won-Jong-
dc.contributor.nonIdAuthorCho, BH-
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MS-Conference Papers(학술회의논문)
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