Improvement of Resonance Characteristics by Two-Step Thermal Annealing in ZnO-based FBAR Devices

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dc.contributor.authorYoon, Giwan-
dc.contributor.authorLinh, Mai-
dc.contributor.authorLee, Jae-young-
dc.contributor.authorPham, Van-Su-
dc.date.accessioned2013-03-26T00:27:56Z-
dc.date.available2013-03-26T00:27:56Z-
dc.date.created2012-02-06-
dc.date.issued2007-07-
dc.identifier.citationITC-CSCC, v., no., pp.494 - 495-
dc.identifier.urihttp://hdl.handle.net/10203/156390-
dc.languageENG-
dc.titleImprovement of Resonance Characteristics by Two-Step Thermal Annealing in ZnO-based FBAR Devices-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage494-
dc.citation.endingpage495-
dc.citation.publicationnameITC-CSCC-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorYoon, Giwan-
dc.contributor.nonIdAuthorLinh, Mai-
dc.contributor.nonIdAuthorLee, Jae-young-
dc.contributor.nonIdAuthorPham, Van-Su-
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EE-Conference Papers(학술회의논문)
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