The electronic structure of oxygen-vacancy in ZnO/HfO2 interface structures
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 장기주 | - |
| dc.contributor.author | 류병기 | - |
| dc.date.accessioned | 2013-03-25T23:56:47Z | - |
| dc.date.available | 2013-03-25T23:56:47Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-10 | - |
| dc.identifier.citation | 한국물리학회 가을학술논문발표회 , v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/156216 | - |
| dc.language | ENG | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | The electronic structure of oxygen-vacancy in ZnO/HfO2 interface structures | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 한국물리학회 가을학술논문발표회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 장기주 | - |
| dc.contributor.nonIdAuthor | 류병기 | - |
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