Continuous scanning phase measurement for high immunity to vibration
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park J. | ko |
| dc.contributor.author | You J. | ko |
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.date.accessioned | 2013-03-25T23:47:05Z | - |
| dc.date.available | 2013-03-25T23:47:05Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-08-03 | - |
| dc.identifier.citation | Optical Inspection and Metrology for Non-Optics Industries | - |
| dc.identifier.issn | 0277-786X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/156168 | - |
| dc.language | English | - |
| dc.publisher | 123 | - |
| dc.title | Continuous scanning phase measurement for high immunity to vibration | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000317931000020 | - |
| dc.identifier.scopusid | 2-s2.0-70449572475 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Optical Inspection and Metrology for Non-Optics Industries | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Diego, CA | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Park J. | - |
| dc.contributor.nonIdAuthor | You J. | - |
- Appears in Collection
- ME-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.