Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ghim Y.-S. | ko |
| dc.contributor.author | You J. | ko |
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.date.accessioned | 2013-03-19T04:18:05Z | - |
| dc.date.available | 2013-03-19T04:18:05Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-08-29 | - |
| dc.identifier.citation | Thin-Film Coatings for Optical Applications IV, pp.6674 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/155667 | - |
| dc.language | English | - |
| dc.publisher | 123 | - |
| dc.title | Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000251498300001 | - |
| dc.identifier.scopusid | 2-s2.0-42149171264 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 6674 | - |
| dc.citation.publicationname | Thin-Film Coatings for Optical Applications IV | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | San Diego, CA | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Ghim Y.-S. | - |
| dc.contributor.nonIdAuthor | You J. | - |
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