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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

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Kim, M. / Kim, J.-Y. / Yoo, Hoi-Junresearcher
Issue Date
2009-04-28
Language
ENG
Citation

2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09, pp.283 - 286

URI
http://hdl.handle.net/10203/155142
Appears in Collection
EE-Conference Papers(학술회의논문)
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