DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, H. | - |
dc.contributor.author | Shim, J. | - |
dc.contributor.author | Shim, Y. | - |
dc.contributor.author | Yoo, J. | - |
dc.contributor.author | Kim, Joungho | - |
dc.date.accessioned | 2013-03-19T02:25:44Z | - |
dc.date.available | 2013-03-19T02:25:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-12-01 | - |
dc.identifier.citation | IEEE 9th VLSI Packaging Workshop in Japan, VPWJ 2008, v., no., pp.73 - 76 | - |
dc.identifier.uri | http://hdl.handle.net/10203/154909 | - |
dc.language | ENG | - |
dc.title | Experimental verification and analysis for noise isolation of analog and digital chip-package-PCB hierarchical power distribution network | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-63049129336 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 73 | - |
dc.citation.endingpage | 76 | - |
dc.citation.publicationname | IEEE 9th VLSI Packaging Workshop in Japan, VPWJ 2008 | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Park, H. | - |
dc.contributor.nonIdAuthor | Shim, J. | - |
dc.contributor.nonIdAuthor | Shim, Y. | - |
dc.contributor.nonIdAuthor | Yoo, J. | - |
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