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College of Engineering(공과대학)Dept. of Nuclear and Quantum Engineering(원자력및양자공학과)NE-Conference Papers(학술회의논문)

Fabrication and comparison Gd202S(Tb) and CsI(TI) films for X-ray imaging detector application

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dc.contributor.authorBo, K.C.ko
dc.contributor.authorShin, J.-H.ko
dc.contributor.authorJong, Y.K.ko
dc.contributor.authorHosang, J.ko
dc.contributor.authorJun, H.B.ko
dc.contributor.authorLee, C.-H.ko
dc.contributor.authorSungho, C.ko
dc.contributor.authorHyoungtaek, K.ko
dc.contributor.authorKim, B.-J.ko
dc.contributor.authorCho, Gyuseongko
dc.date.accessioned2013-03-19T02:22:20Z-
dc.date.available2013-03-19T02:22:20Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-10-19-
dc.identifier.citation2008 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2008, pp.1232 - 1235-
dc.identifier.issn1095-7863-
dc.identifier.urihttp://hdl.handle.net/10203/154879-
dc.languageEnglish-
dc.publisher123-
dc.titleFabrication and comparison Gd202S(Tb) and CsI(TI) films for X-ray imaging detector application-
dc.typeConference-
dc.identifier.wosid000268656000114-
dc.identifier.scopusid2-s2.0-67649212004-
dc.type.rimsCONF-
dc.citation.beginningpage1232-
dc.citation.endingpage1235-
dc.citation.publicationname2008 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2008-
dc.identifier.conferencecountryGE-
dc.identifier.conferencelocationDresden-
dc.contributor.localauthorCho, Gyuseong-
dc.contributor.nonIdAuthorBo, K.C.-
dc.contributor.nonIdAuthorShin, J.-H.-
dc.contributor.nonIdAuthorJong, Y.K.-
dc.contributor.nonIdAuthorHosang, J.-
dc.contributor.nonIdAuthorJun, H.B.-
dc.contributor.nonIdAuthorLee, C.-H.-
dc.contributor.nonIdAuthorSungho, C.-
dc.contributor.nonIdAuthorHyoungtaek, K.-
dc.contributor.nonIdAuthorKim, B.-J.-
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NE-Conference Papers(학술회의논문)
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