Effect of ion-irradiation induced defect on the optically active Er ions in Er-doped silicon-rich silicon oxide
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeong, H. | - |
| dc.contributor.author | Seo, S.-Y. | - |
| dc.contributor.author | Shin, JungHoon | - |
| dc.date.accessioned | 2013-03-19T00:59:28Z | - |
| dc.date.available | 2013-03-19T00:59:28Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-09-19 | - |
| dc.identifier.citation | 2007 4th International Conference on Group IV Photonics, GFP 2007, v., no., pp.85 - 87 | - |
| dc.identifier.issn | 1949-2081 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/154260 | - |
| dc.language | ENG | - |
| dc.title | Effect of ion-irradiation induced defect on the optically active Er ions in Er-doped silicon-rich silicon oxide | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-78649882687 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 85 | - |
| dc.citation.endingpage | 87 | - |
| dc.citation.publicationname | 2007 4th International Conference on Group IV Photonics, GFP 2007 | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Shin, JungHoon | - |
| dc.contributor.nonIdAuthor | Jeong, H. | - |
| dc.contributor.nonIdAuthor | Seo, S.-Y. | - |
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