DC Field | Value | Language |
---|---|---|
dc.contributor.author | Fasel, Tim | ko |
dc.contributor.author | Sohn, Hoon | ko |
dc.contributor.author | Farrar, Charles R. | ko |
dc.date.accessioned | 2013-03-18T22:57:49Z | - |
dc.date.available | 2013-03-18T22:57:49Z | - |
dc.date.created | 2012-10-24 | - |
dc.date.created | 2012-10-24 | - |
dc.date.issued | 2003-03-02 | - |
dc.identifier.citation | SPIE’s 10th Annual International Symposium on Smart Structures and Materials | - |
dc.identifier.uri | http://hdl.handle.net/10203/153364 | - |
dc.language | English | - |
dc.publisher | SPIE | - |
dc.title | Damage detection using extreme value statistics on frequency domain ARX models | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | SPIE’s 10th Annual International Symposium on Smart Structures and Materials | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | San Diego, CA | - |
dc.contributor.localauthor | Sohn, Hoon | - |
dc.contributor.nonIdAuthor | Fasel, Tim | - |
dc.contributor.nonIdAuthor | Farrar, Charles R. | - |
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