DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kwon, Hyuk-Sang | - |
dc.date.accessioned | 2013-03-18T18:47:28Z | - |
dc.date.available | 2013-03-18T18:47:28Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-06-01 | - |
dc.identifier.citation | The 56th Annual Meeting of the international Society of Electrochemistry, v., no., pp.673 - 673 | - |
dc.identifier.uri | http://hdl.handle.net/10203/151341 | - |
dc.language | ENG | - |
dc.title | Analysis of passivity breakdown on Fe and Ni according to the point defect model | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 673 | - |
dc.citation.endingpage | 673 | - |
dc.citation.publicationname | The 56th Annual Meeting of the international Society of Electrochemistry | - |
dc.contributor.localauthor | Kwon, Hyuk-Sang | - |
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