DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang S. | - |
dc.contributor.author | Ahn Y. | - |
dc.contributor.author | Choi H. | - |
dc.contributor.author | Elimelech M. | - |
dc.date.accessioned | 2013-03-18T18:09:22Z | - |
dc.date.available | 2013-03-18T18:09:22Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-05-07 | - |
dc.identifier.citation | 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings, v., no., pp.592 - 594 | - |
dc.identifier.uri | http://hdl.handle.net/10203/151057 | - |
dc.language | ENG | - |
dc.title | New guidelines for selecting best extraction methods of EPS using atomic force microscopy | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-33845194209 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 592 | - |
dc.citation.endingpage | 594 | - |
dc.citation.publicationname | 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kang S. | - |
dc.contributor.localauthor | Ahn Y. | - |
dc.contributor.localauthor | Choi H. | - |
dc.contributor.nonIdAuthor | Elimelech M. | - |
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