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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

EXAFS analysis and electronic structure of hafnium oxynitride thin films for phase shift

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dc.contributor.authorNo, Kwangsoo-
dc.contributor.authorKim, Sung Kwan-
dc.contributor.authorKim, Yang-Soo-
dc.contributor.authorJeon, Young-Ah-
dc.date.accessioned2013-03-18T17:33:52Z-
dc.date.available2013-03-18T17:33:52Z-
dc.date.created2012-02-06-
dc.date.issued2005-06-14-
dc.identifier.citationInternational Conference on Electroceramics 2005 (ICE2005), v.0, no.0, pp.0 - 0-
dc.identifier.urihttp://hdl.handle.net/10203/150777-
dc.languageENG-
dc.publishernternational Conference on Electroceramics 2005 (ICE2005)-
dc.titleEXAFS analysis and electronic structure of hafnium oxynitride thin films for phase shift-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.volume0-
dc.citation.issue0-
dc.citation.beginningpage0-
dc.citation.endingpage0-
dc.citation.publicationnameInternational Conference on Electroceramics 2005 (ICE2005)-
dc.identifier.conferencecountryGermany-
dc.identifier.conferencecountryGermany-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorKim, Sung Kwan-
dc.contributor.nonIdAuthorKim, Yang-Soo-
dc.contributor.nonIdAuthorJeon, Young-Ah-
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MS-Conference Papers(학술회의논문)
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