Measuremet and Analysis of the Conducting Filament in Al/p-a-Si:H/Al Thin Film Device and its Switching Properties
- Issue Date
- 2006
- Language
- ENG
- Citation
International Conference on Nanoscience and Technology, pp.1434 -
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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