Observation of Thermal Reliability of BCB Passivated InAlAs/InGaAs HEMTs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yoon, M | - |
| dc.contributor.author | Kim, T | - |
| dc.contributor.author | Kim, D | - |
| dc.contributor.author | Yang, Kyounghoon | - |
| dc.date.accessioned | 2013-03-18T16:30:12Z | - |
| dc.date.available | 2013-03-18T16:30:12Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003-09-16 | - |
| dc.identifier.citation | Int. Conf. on Solid State Devices and Materials, v., no., pp.122 - 123 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/150227 | - |
| dc.language | ENG | - |
| dc.title | Observation of Thermal Reliability of BCB Passivated InAlAs/InGaAs HEMTs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 122 | - |
| dc.citation.endingpage | 123 | - |
| dc.citation.publicationname | Int. Conf. on Solid State Devices and Materials | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Yang, Kyounghoon | - |
| dc.contributor.nonIdAuthor | Yoon, M | - |
| dc.contributor.nonIdAuthor | Kim, T | - |
| dc.contributor.nonIdAuthor | Kim, D | - |
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