Noise Analysis and Modeling of Microwave AlGaN/GaN HEMTs Considering Trap Effects
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hwang, M | - |
| dc.contributor.author | Yang, Kyounghoon | - |
| dc.date.accessioned | 2013-03-18T16:27:50Z | - |
| dc.date.available | 2013-03-18T16:27:50Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005 | - |
| dc.identifier.citation | International Joint Conference of MINT-MIS 2005/TSMMW 2005, v., no., pp.136 - 139 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/150211 | - |
| dc.language | ENG | - |
| dc.title | Noise Analysis and Modeling of Microwave AlGaN/GaN HEMTs Considering Trap Effects | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 136 | - |
| dc.citation.endingpage | 139 | - |
| dc.citation.publicationname | International Joint Conference of MINT-MIS 2005/TSMMW 2005 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Yang, Kyounghoon | - |
| dc.contributor.nonIdAuthor | Hwang, M | - |
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