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Showing results 1 to 6 of 6

1
Exit Recursion Models of Clustered Photolithography Tools for Fab Level Simulation

Park, Jung Yeon; Park, Kyungsu; Morrison, James R., IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.30, no.1, pp.39 - 51, 2017-02

2
Interclass collision protection (ICP) model for IEEE 802.11e wireless LANs (WLANs) = IEEE 802.11e 무선랜에서 클래스간 충돌 방지 모형link

Cho, Woon-Sun; 조운선; et al, 한국과학기술원, 2007

3
New linear program performance bounds for closed queueing networks

Morrison, James R; Kumar, PR, DISCRETE EVENT DYNAMIC SYSTEMS-THEORY AND APPLICATIONS, v.11, no.4, pp.291 - 317, 2001-10

4
On the guaranteed throughput and efficiency of closed re-entrant lines

Morrison, James R; Kumar, PR, QUEUEING SYSTEMS, v.28, no.1-3, pp.33 - 54, 1998

5
Performance evaluation of photolithography cluster tools

Morrison, James R; Martin, DP, OR SPECTRUM, v.29, no.3, pp.375 - 389, 2007-07

6
다종 고객이 도착하는 얼랑 손실 시스템 = A study on erlang loss system with multi-type customerslink

강진우; Kang, Jin-Woo; et al, 한국과학기술원, 2013

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