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A classifier learning system using a coevolution method for deflection yoke misconvergence pattern classification problem Lee, Ki K.; Yoon, Wan Chul, INFORMATION SCIENCES, v.178, no.5, pp.1372 - 1390, 2008-03 |
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
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