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Showing results 1 to 3 of 3

1
Layered Behavior Modeling via Combining Descriptive and Prescriptive Approaches: a Case Study of Infantry Company Engagement

Bae, Jang Won; Lee, Junseok; Kim, Do-Hyung; Lee, Kang Hoon; Lee, Jongmin; Kim, Kee-Eung; Moon, Il-Chul, IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS, v.50, no.7, pp.2551 - 2565, 2020-07

2
Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification

Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11

3
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

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