Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject Out-of-distribution defect pattern▼auncertainty▼aclassification▼adeep learning▼asemiconductor manufacturing process▼awafer bin map
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| Classification and out-of-distribution detection for wafer bin maps = 웨이퍼 결함 패턴 분류 및 분포 외 패턴 탐지link Choi, Jeongman; Kim, Heeyoung; et al, 한국과학기술원, 2023 |
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