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Showing results 1 to 6 of 6

1
A Bayesian nonparametric mixture measurement error model with application to spatial density estimation using mobile positioning data with multi-accuracy and multi-coverage

Lee, Youngmin; Jeong, Taewon; Kim, Heeyoung, TECHNOMETRICS, v.62, no.2, pp.173 - 183, 2020-04

2
Bayesian Nonparametric Joint Mixture Model for Clustering Spatially Correlated Time Series

Lee, Youngmin; Kim, Heeyoung, TECHNOMETRICS, v.62, no.3, pp.313 - 329, 2020-07

3
Bayesian nonparametric latent class model for longitudinal data

Koo, Wonmo; Kim, Heeyoung, STATISTICAL METHODS IN MEDICAL RESEARCH, v.29, no.11, pp.3381 - 3395, 2020-11

4
Detection and clustering of mixed-type defect patterns in wafer bin maps

Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01

5
Detection and clustering of mixed-type defect patterns in Wafer Bin maps = 웨이퍼 빈 맵의 혼합된 형태의 결함 패턴 탐지 및 분류link

Kim, Jinho; 김진호; et al, 한국과학기술원, 2016

6
Variational Deep Clustering of Wafer Map Patterns

Hwang, Jonghyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08

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