Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject Classification
Showing results 1 to 11 of 11
| A nonparametric approach based on a Markov like property for classification Park, Eun Sug; Spiegelman, Clifford; Ahn, Jeongyoun, CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, v.108, no.2, pp.87 - 92, 2011-10 |
| Classification algorithms via integer optimization = 정수최적화를 이용한 분류 해법link Kang, Ja-Young; 강자영; et al, 한국과학기술원, 2010 |
| Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08 |
| Comparisons of classification methods in the original and pattern spaces Han, Jeong; Kim, Norman; Jeong, Myong K.; Yum, Bong-Jin, EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.10, pp.12432 - 12438, 2011-09 |
| Comparisons of classification methods in the original and pattern spaces and development of new pattern selection approaches for the logical analysis of data = 원래의 영역과 패턴 영역에서의 분류 기법 비교와 LAD의 패턴 선택 방법 개발link Han, Jeong; 한정; et al, 한국과학기술원, 2010 |
| General sparse multi-class linear discriminant analysis Safo, Sandra E.; Ahn, Jeongyoun, COMPUTATIONAL STATISTICS & DATA ANALYSIS, v.99, pp.81 - 90, 2016-07 |
| Learning From Noisy Labels With Deep Neural Networks: A Survey Song, Hwanjun; Kim, Minseok; Park, Dongmin; Shin, Yooju; Lee, Jae-Gil, IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, v.34, no.11, pp.8135 - 8153, 2023-11 |
| Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern Han, Jeong; Kim, Norman; Yum, Bong-Jin; Jeong, Myong K., EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.11, pp.13857 - 13862, 2011-10 |
| Penalized Orthogonal Iteration for Sparse Estimation of Generalized Eigenvalue Problem Jung, Sungkyu; Ahn, Jeongyoun; Jeon, Yongho, JOURNAL OF COMPUTATIONAL AND GRAPHICAL STATISTICS, v.28, no.3, pp.710 - 721, 2019-07 |
| Semi-supervised bearing fault diagnosis with adversarially trained phase-consistent network = 적대적 위상 일치 신경망을 사용한 준지도 베어링 이상 진단link Yi, Jaehyuk; Park, Jinkyoo; et al, 한국과학기술원, 2021 |
| The maximal data piling direction for discrimination Ahn, Jeongyoun; Marron, J. S., BIOMETRIKA, v.97, no.1, pp.254 - 259, 2010-03 |
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