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Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 |
Wind Field-Based Short-Term Turbine Response Forecasting by Stacked Dilated Convolutional LSTMs Woo, Seongcheol; Park, Junyoung; Park, Jinkyoo; Manuel, Lance, IEEE Transactions on Sustainable Energy, v.11, no.4, pp.2294 - 2304, 2020-10 |
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