Showing results 1 to 4 of 4
An Analysis of Description Logic Augmented with Domain Rules for the Development of Product Models Fiorentini, Xenia; Rachuri, Sudarsan; Suh, Hyo-Won; Lee, Jaehyun; Sriram, Ram D., JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING, v.10, no.2, 2010-06 |
Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps = 웨이퍼 혼합 결함 패턴의 위치 탐지와 분류를 위한 준지도 학습link Lee, Jaehyun; Kim, Heeyoung; et al, 한국과학기술원, 2022 |
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 |
The Exchange of the Product Structure Information Using RDF/XML in the CPC environment Lee, Jaehyun; Suh, Hyo-Won, 2003 Society of CAD CAM Engineers International Symposium, pp.263 - 270, 2003 |
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