Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Author Lee, Hyuck
Showing results 1 to 4 of 4
| ABC: Auxiliary Balanced Classifier for Class-imbalanced Semi-supervised Learning Lee, Hyuck; Shin, Seungjae; Kim, Heeyoung, 35th Conference on Neural Information Processing Systems, NeurIPS 2021, pp.7082 - 7094, Neural Information Processing Systems Foundation, 2021-12-08 |
| Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 |
| Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
| Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns = 준지도 다중 라벨 학습을 이용한 혼합된 형태의 결함 패턴을 가진 반도체 웨이퍼 빈맵 분류link Lee, Hyuck; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
Discover
Open Access
Date issued
- 660 2020 - 2024
- 1,944 2010 - 2019
- 1,604 2000 - 2009
- 1,156 1990 - 1999
- 507 1980 - 1989