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Prediction of highly imbalanced semiconductor chip-level defects in module tests using multimodal fusion and logit adjustment = 다중 모드 데이터 융합과 로짓 조정을 이용한 모듈 검사에서의 고도로 불균형한 반도체 칩 단위 결함 예측link Cho, Hunsung; Kim, Heeyoung; et al, 한국과학기술원, 2023 |
Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment Cho, Hunsung; Koo, Wonmo; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08 |
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