Showing results 4 to 6 of 6
Detection and clustering of mixed-type defect patterns in wafer bin maps Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01 |
Detection and clustering of mixed-type defect patterns in Wafer Bin maps = 웨이퍼 빈 맵의 혼합된 형태의 결함 패턴 탐지 및 분류link Kim, Jinho; 김진호; et al, 한국과학기술원, 2016 |
Variational Deep Clustering of Wafer Map Patterns Hwang, Jonghyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08 |
Discover