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A classification method using a hybrid genetic algorithm combined with an adaptive procedure for the pool of ellipsoids Lee, KK; Yoon, Wan Chul; Baek, DH, APPLIED INTELLIGENCE, v.25, pp.293 - 304, 2006-12 |
Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment Cho, Hunsung; Koo, Wonmo; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08 |
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