Ellipsometry analysis of hydrogenated HgCdTe

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dc.contributor.authorLee, Hee Chul-
dc.contributor.authorYANG, K-
dc.contributor.authorKIM, YH-
dc.date.accessioned2013-03-18T15:10:52Z-
dc.date.available2013-03-18T15:10:52Z-
dc.date.created2012-02-06-
dc.date.issued2004-
dc.identifier.citation2004 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/149604-
dc.languageENG-
dc.titleEllipsometry analysis of hydrogenated HgCdTe-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2004 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorLee, Hee Chul-
dc.contributor.nonIdAuthorYANG, K-
dc.contributor.nonIdAuthorKIM, YH-
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EE-Conference Papers(학술회의논문)
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