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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

AFM Observations and Finite Element Analysis of Cracks of Thin Films on Substrates

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dc.contributor.authorLee, Soon-Bok-
dc.contributor.authorBae, Keun-Ho-
dc.contributor.authorBaek, DC-
dc.date.accessioned2013-03-18T14:21:03Z-
dc.date.available2013-03-18T14:21:03Z-
dc.date.created2012-02-06-
dc.date.issued2005-
dc.identifier.citationTokyo Tech-KAIST joint workshop, v., no., pp.48 - 49-
dc.identifier.urihttp://hdl.handle.net/10203/149230-
dc.languageENG-
dc.titleAFM Observations and Finite Element Analysis of Cracks of Thin Films on Substrates-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage48-
dc.citation.endingpage49-
dc.citation.publicationnameTokyo Tech-KAIST joint workshop-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.nonIdAuthorBae, Keun-Ho-
dc.contributor.nonIdAuthorBaek, DC-
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ME-Conference Papers(학술회의논문)
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