Device characteristics of normal- incidence long-wavelength (λ ~5um) InAs/GaAs quantum-dot infrared photodetectors(Invited)

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dc.contributor.author홍성철-
dc.contributor.author이상준-
dc.contributor.author노삼규-
dc.contributor.author이욱현-
dc.contributor.author이정일-
dc.date.accessioned2013-03-18T13:52:11Z-
dc.date.available2013-03-18T13:52:11Z-
dc.date.created2012-02-06-
dc.date.issued2004-
dc.identifier.citationKorean Conference on Semiconductors, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/149011-
dc.languageKOR-
dc.titleDevice characteristics of normal- incidence long-wavelength (λ ~5um) InAs/GaAs quantum-dot infrared photodetectors(Invited)-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameKorean Conference on Semiconductors-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor홍성철-
dc.contributor.nonIdAuthor이상준-
dc.contributor.nonIdAuthor노삼규-
dc.contributor.nonIdAuthor이욱현-
dc.contributor.nonIdAuthor이정일-
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EE-Conference Papers(학술회의논문)
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