DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, Songcheol | - |
dc.contributor.author | Mheen, Bongki | - |
dc.contributor.author | Song, Young-Joo | - |
dc.contributor.author | Kang, Jin-Young | - |
dc.date.accessioned | 2013-03-18T13:37:04Z | - |
dc.date.available | 2013-03-18T13:37:04Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | 27th International Conference on the Physics of Semiconductors, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/148917 | - |
dc.language | ENG | - |
dc.title | Unusual 1/f Noise Behavior in MOSFETs with a sub-1.5 nm Gate Oxide under Electrical Stress | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 27th International Conference on the Physics of Semiconductors | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Hong, Songcheol | - |
dc.contributor.nonIdAuthor | Mheen, Bongki | - |
dc.contributor.nonIdAuthor | Song, Young-Joo | - |
dc.contributor.nonIdAuthor | Kang, Jin-Young | - |
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