DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.contributor.author | Ghim, YS | - |
dc.date.accessioned | 2013-03-18T09:05:30Z | - |
dc.date.available | 2013-03-18T09:05:30Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-10 | - |
dc.identifier.citation | kspe, v., no., pp.39 - 46 | - |
dc.identifier.uri | http://hdl.handle.net/10203/146820 | - |
dc.language | ENG | - |
dc.title | Advancement of white-light interferometry for 3-D profile metrology of micro-structured surfaces | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 39 | - |
dc.citation.endingpage | 46 | - |
dc.citation.publicationname | kspe | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Ghim, YS | - |
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