DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, DY | - |
dc.contributor.author | Lee, MY | - |
dc.contributor.author | Park, JH | - |
dc.contributor.author | Gweon Dae Gab | - |
dc.date.accessioned | 2013-03-18T07:16:27Z | - |
dc.date.available | 2013-03-18T07:16:27Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-10-28 | - |
dc.identifier.citation | Nanoengineering Symposium 2005, v., no., pp.360 - 365 | - |
dc.identifier.uri | http://hdl.handle.net/10203/145917 | - |
dc.language | ENG | - |
dc.title | A flexure-guided scanner for an atomic force microscope: design and performance | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 360 | - |
dc.citation.endingpage | 365 | - |
dc.citation.publicationname | Nanoengineering Symposium 2005 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Gweon Dae Gab | - |
dc.contributor.nonIdAuthor | Lee, DY | - |
dc.contributor.nonIdAuthor | Lee, MY | - |
dc.contributor.nonIdAuthor | Park, JH | - |
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