DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jin, J | - |
dc.contributor.author | Kim, YJ | - |
dc.contributor.author | Kim, Seung-Woo | - |
dc.date.accessioned | 2013-03-18T06:38:00Z | - |
dc.date.available | 2013-03-18T06:38:00Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-10-26 | - |
dc.identifier.citation | nanoengineering symposium 2005, v., no., pp.192 - 197 | - |
dc.identifier.uri | http://hdl.handle.net/10203/145667 | - |
dc.language | ENG | - |
dc.title | Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 192 | - |
dc.citation.endingpage | 197 | - |
dc.citation.publicationname | nanoengineering symposium 2005 | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Jin, J | - |
dc.contributor.nonIdAuthor | Kim, YJ | - |
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