Microstructural properties of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substrates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.date.accessioned | 2013-03-18T06:33:29Z | - |
| dc.date.available | 2013-03-18T06:33:29Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2006-09-10 | - |
| dc.identifier.citation | IUMRS-ICA, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/145638 | - |
| dc.language | ENG | - |
| dc.title | Microstructural properties of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substrates | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IUMRS-ICA | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Jeong Yong | - |
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