Guideline for Worst Hot Carrier Stress Condition Using Substrate Current in a Body-Tied FinFET
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Yang-Kyu | - |
| dc.contributor.author | Han, Jin-Woo | - |
| dc.contributor.author | Lee, Hyunjin | - |
| dc.contributor.author | Lee, Choong-Ho | - |
| dc.contributor.author | Park, Donggun | - |
| dc.date.accessioned | 2013-03-18T05:19:59Z | - |
| dc.date.available | 2013-03-18T05:19:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-02 | - |
| dc.identifier.citation | The 12th Korean Conference on Semiconductors (KCS), v., no., pp.99 - 100 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/145099 | - |
| dc.language | KOR | - |
| dc.title | Guideline for Worst Hot Carrier Stress Condition Using Substrate Current in a Body-Tied FinFET | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 99 | - |
| dc.citation.endingpage | 100 | - |
| dc.citation.publicationname | The 12th Korean Conference on Semiconductors (KCS) | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.nonIdAuthor | Han, Jin-Woo | - |
| dc.contributor.nonIdAuthor | Lee, Hyunjin | - |
| dc.contributor.nonIdAuthor | Lee, Choong-Ho | - |
| dc.contributor.nonIdAuthor | Park, Donggun | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.