DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Yang-Kyu | - |
dc.contributor.author | Han, J.-W. | - |
dc.contributor.author | Lee, H. | - |
dc.date.accessioned | 2013-03-18T04:02:51Z | - |
dc.date.available | 2013-03-18T04:02:51Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-10-23 | - |
dc.identifier.citation | ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, v., no., pp.1101 - 1104 | - |
dc.identifier.uri | http://hdl.handle.net/10203/144578 | - |
dc.language | ENG | - |
dc.title | Reliability issues in multi-gate FinFETs | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-34547322889 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1101 | - |
dc.citation.endingpage | 1104 | - |
dc.citation.publicationname | ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology | - |
dc.identifier.conferencecountry | China | - |
dc.identifier.conferencecountry | China | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.contributor.nonIdAuthor | Han, J.-W. | - |
dc.contributor.nonIdAuthor | Lee, H. | - |
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