Two-point diffraction interferometer for absolute distance measurement

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 506
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKim, Seung-Woo-
dc.contributor.authorRhee H.-G.-
dc.contributor.authorJoo J.-Y.-
dc.contributor.authorKim Y.-J.-
dc.date.accessioned2013-03-18T03:47:14Z-
dc.date.available2013-03-18T03:47:14Z-
dc.date.created2012-02-06-
dc.date.issued2004-08-02-
dc.identifier.citationInterferometry XII: Techniques and Analysis, v.5531, no., pp.162 - 169-
dc.identifier.urihttp://hdl.handle.net/10203/144474-
dc.languageENG-
dc.titleTwo-point diffraction interferometer for absolute distance measurement-
dc.typeConference-
dc.identifier.scopusid2-s2.0-15744386100-
dc.type.rimsCONF-
dc.citation.volume5531-
dc.citation.beginningpage162-
dc.citation.endingpage169-
dc.citation.publicationnameInterferometry XII: Techniques and Analysis-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorRhee H.-G.-
dc.contributor.nonIdAuthorJoo J.-Y.-
dc.contributor.nonIdAuthorKim Y.-J.-
Appears in Collection
ME-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0