DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yum, Bong-Jin | - |
dc.contributor.author | Kim, SH | - |
dc.contributor.author | Kim, M | - |
dc.date.accessioned | 2013-03-18T03:15:05Z | - |
dc.date.available | 2013-03-18T03:15:05Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | International Conference on Computers and Industrial Engineering, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/144234 | - |
dc.language | ENG | - |
dc.title | Reliability Acceptance Sampling Plans under Accelerated Life Testing and Type II Censoring | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Computers and Industrial Engineering | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Yum, Bong-Jin | - |
dc.contributor.nonIdAuthor | Kim, SH | - |
dc.contributor.nonIdAuthor | Kim, M | - |
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