DC Field | Value | Language |
---|---|---|
dc.contributor.author | Son, HY | - |
dc.contributor.author | Yeo, YW | - |
dc.contributor.author | Jung, GJ | - |
dc.contributor.author | Lee, JK | - |
dc.contributor.author | Choi, JY | - |
dc.contributor.author | Park, CJ | - |
dc.contributor.author | Suh, MS | - |
dc.contributor.author | Cho, SJ | - |
dc.contributor.author | Paik, Kyung-Wook | - |
dc.date.accessioned | 2013-03-18T01:21:52Z | - |
dc.date.available | 2013-03-18T01:21:52Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-12-11 | - |
dc.identifier.citation | EMAP 2005: 2005 International Symposium on Electronics Materials and Packaging, v.2005, no., pp.95 - 100 | - |
dc.identifier.uri | http://hdl.handle.net/10203/143544 | - |
dc.language | ENG | - |
dc.title | Studies on double-layered metal bumps for fine pitch flip chip applications | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-33847331074 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 2005 | - |
dc.citation.beginningpage | 95 | - |
dc.citation.endingpage | 100 | - |
dc.citation.publicationname | EMAP 2005: 2005 International Symposium on Electronics Materials and Packaging | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Paik, Kyung-Wook | - |
dc.contributor.nonIdAuthor | Son, HY | - |
dc.contributor.nonIdAuthor | Yeo, YW | - |
dc.contributor.nonIdAuthor | Jung, GJ | - |
dc.contributor.nonIdAuthor | Lee, JK | - |
dc.contributor.nonIdAuthor | Choi, JY | - |
dc.contributor.nonIdAuthor | Park, CJ | - |
dc.contributor.nonIdAuthor | Suh, MS | - |
dc.contributor.nonIdAuthor | Cho, SJ | - |
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