DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sohn, YC | - |
dc.contributor.author | Yu, Jin | - |
dc.contributor.author | Kang, SK | - |
dc.contributor.author | Shih, DY | - |
dc.contributor.author | Lee, TY | - |
dc.date.accessioned | 2013-03-18T01:11:41Z | - |
dc.date.available | 2013-03-18T01:11:41Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-06-01 | - |
dc.identifier.citation | 2004 Proceedings - 54th Electronic Components and Technology Conference, v.1, no., pp.75 - 81 | - |
dc.identifier.issn | 0569-5503 | - |
dc.identifier.uri | http://hdl.handle.net/10203/143454 | - |
dc.language | ENG | - |
dc.title | Study of spalling behavior of Intel-metallic compounds during the reaction between electroless Ni-P metallization and lead-free solders | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-10344267518 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 1 | - |
dc.citation.beginningpage | 75 | - |
dc.citation.endingpage | 81 | - |
dc.citation.publicationname | 2004 Proceedings - 54th Electronic Components and Technology Conference | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Yu, Jin | - |
dc.contributor.nonIdAuthor | Sohn, YC | - |
dc.contributor.nonIdAuthor | Kang, SK | - |
dc.contributor.nonIdAuthor | Shih, DY | - |
dc.contributor.nonIdAuthor | Lee, TY | - |
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