분산형 백색광 간섭계를 이용한 박막 두께 측정Dispersive White-light Interferometry for Thin-film Thickness Measurement
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김영식 | - |
| dc.contributor.author | 유준호 | - |
| dc.contributor.author | 김승우 | - |
| dc.date.accessioned | 2013-03-18T00:45:54Z | - |
| dc.date.available | 2013-03-18T00:45:54Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-07-14 | - |
| dc.identifier.citation | 한국광학회 2005년도 하계학술발표회, v., no., pp.24 - 25 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/143302 | - |
| dc.language | KOR | - |
| dc.publisher | 한국광학회 | - |
| dc.title | 분산형 백색광 간섭계를 이용한 박막 두께 측정 | - |
| dc.title.alternative | Dispersive White-light Interferometry for Thin-film Thickness Measurement | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 24 | - |
| dc.citation.endingpage | 25 | - |
| dc.citation.publicationname | 한국광학회 2005년도 하계학술발표회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 김승우 | - |
| dc.contributor.nonIdAuthor | 김영식 | - |
| dc.contributor.nonIdAuthor | 유준호 | - |
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